1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
This paper presents the adoption of the Triple Modular Redundancy coupled with the Partial Dynamic Reconfiguration of Field Programmable Gate Arrays to mitigate the effects of Sof...
Cristiana Bolchini, Antonio Miele, Marco D. Santam...
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...
Abstract-- With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends su...
Decreasing feature sizes have led to an increased vulnerability of random logic to soft errors. A particle strike may cause a glitch or single event transient (SET) at the output ...
Sybille Hellebrand, Christian G. Zoellin, Hans-Joa...