In order to achieve fault tolerance, highly reliable system often require the ability to detect errors as soon as they occur and prevent the speared of erroneous information throu...
We describe a method for designing fault tolerant circuits based on an extension of a Concurrent Error Detection (CED) technique. The proposed extension combines parity check code...
Individual functional requirements represent fragments of behavior, while a design that satisfies a set of functional requirements represents integrated behavior. This perspective ...
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
Bing-Chuan Bai, Augusli Kifli, Chien-Mo James Li, ...
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...