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» Device and Technology Challenges for Nanoscale CMOS
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ASPDAC
2008
ACM
103views Hardware» more  ASPDAC 2008»
13 years 11 months ago
Reliability-aware design for nanometer-scale devices
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
David Atienza, Giovanni De Micheli, Luca Benini, J...
GLOBECOM
2009
IEEE
14 years 27 days ago
On-Chip Integrated Antenna Structures in CMOS for 60 GHz WPAN Systems
Abstract--This paper presents several on-chip antenna structures that may be fabricated with standard CMOS technology for use at millimeter wave frequencies. On-chip antennas for w...
Felix Gutierrez Jr., Kristen Parrish, Theodore S. ...
DAC
2011
ACM
12 years 8 months ago
Rethinking memory redundancy: optimal bit cell repair for maximum-information storage
SRAM design has been a major challenge for nanoscale manufacturing technology. We propose a new bit cell repair scheme for designing maximum-information memory system (MIMS). Unli...
Xin Li
GLVLSI
2010
IEEE
310views VLSI» more  GLVLSI 2010»
14 years 1 months ago
Graphene tunneling FET and its applications in low-power circuit design
Graphene nanoribbon tunneling FETs (GNR TFETs) are promising devices for post-CMOS low-power applications because of the low subthreshold swing, high Ion/Ioff, and potential for l...
Xuebei Yang, Jyotsna Chauhan, Jing Guo, Kartik Moh...
DAC
2008
ACM
14 years 10 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao