45 search results - page 6 / 9 » Diagonal Circuit Identity Testing and Lower Bounds |
COLT
2008
Springer
13 years 9 months ago
2008
Springer
We define a model of learning probabilistic acyclic circuits using value injection queries, in which an arbitrary subset of wires is set to fixed values, and the value on the sing...
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
We show how to implement an arbitrary two-qubit unitary operation using any of several quantum gate libraries with small a priori upper bounds on gate counts. In analogy to librar...
ETS
2009
IEEE
13 years 5 months ago
2009
IEEE
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
DATE
2003
IEEE
14 years 28 days ago
2003
IEEE
The growing impact of within-die process variation has created the need for statistical timing analysis, where gate delays are modeled as random variables. Statistical timing anal...
FCT
2007
Springer
14 years 1 months ago
2007
Springer
We present quantum query complexity bounds for testing algebraic properties. For a set S and a binary operation on S, we consider the decision problem whether S is a semigroup or ...