787 search results - page 68 / 158 » Digital Algebra and Circuits |
VTS
2003
IEEE
14 years 2 months ago
2003
IEEE
We present a novel analog checker that adjusts dynamically the error threshold to the magnitude of its input signals. We demonstrate that this property is crucial for accurate con...
ICCAD
2000
IEEE
14 years 1 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ISQED
2000
IEEE
14 years 1 months ago
2000
IEEE
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
ICCAD
2003
IEEE
14 years 5 months ago
2003
IEEE
We present a new approach for TAM optimization and test scheduling in the modular testing of mixed-signal SOCs. A test planning approach for digital SOCs is extended to handle ana...
EH
1999
IEEE
14 years 1 months ago
1999
IEEE
An evolutionary algorithm is used to evolve a digital circuit which computes a simple hash function mapping a 16bit address space into an 8-bit one. The target technology is FPGA,...