We present a novel analog checker that adjusts dynamically the error threshold to the magnitude of its input signals. We demonstrate that this property is crucial for accurate con...
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
Power and energy consumption of digital systems may increase significantly during testing. This extra power consumption due to test application may give rise to severe hazards to ...
We present a new approach for TAM optimization and test scheduling in the modular testing of mixed-signal SOCs. A test planning approach for digital SOCs is extended to handle ana...
An evolutionary algorithm is used to evolve a digital circuit which computes a simple hash function mapping a 16bit address space into an 8-bit one. The target technology is FPGA,...
Ernesto Damiani, Andrea Tettamanzi, Valentino Libe...