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» Domain Reduction for the Circuit Constraint
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DATE
2010
IEEE
156views Hardware» more  DATE 2010»
13 years 9 months ago
Defect aware X-filling for low-power scan testing
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
S. Balatsouka, V. Tenentes, Xrysovalantis Kavousia...
ICCAD
2006
IEEE
110views Hardware» more  ICCAD 2006»
14 years 4 months ago
Voltage island aware floorplanning for power and timing optimization
Power consumption is a crucial concern in nanometer chip design. Researchers have shown that multiple supply voltage (MSV) is an effective method for power consumption reduction....
Wan-Ping Lee, Hung-Yi Liu, Yao-Wen Chang
APCCAS
2006
IEEE
229views Hardware» more  APCCAS 2006»
14 years 1 months ago
Low Power Combinational Multipliers using Data-driven Signal Gating
— A data driven approach to design and optimization of low power combinational multipliers is presented. This technique depends on signal gating to avoid un-necessary computation...
Nima Honarmand, Ali Afzali-Kusha
DAC
2003
ACM
14 years 19 days ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
ICCAD
1994
IEEE
144views Hardware» more  ICCAD 1994»
13 years 11 months ago
Power analysis of embedded software: a first step towards software power minimization
Embedded computer systems are characterized by the presence of a dedicated processor and the software that runs on it. Power constraints are increasingly becoming the critical com...
Vivek Tiwari, Sharad Malik, Andrew Wolfe