Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
S. Balatsouka, V. Tenentes, Xrysovalantis Kavousia...
Power consumption is a crucial concern in nanometer chip design. Researchers have shown that multiple supply voltage (MSV) is an effective method for power consumption reduction....
— A data driven approach to design and optimization of low power combinational multipliers is presented. This technique depends on signal gating to avoid un-necessary computation...
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Embedded computer systems are characterized by the presence of a dedicated processor and the software that runs on it. Power constraints are increasingly becoming the critical com...