- Dynamic power consumption in CMOS circuits is usually estimated based on the number of signal transitions. However, when considering glitches, this is not accurate because narrow...
— This paper introduces a simple analytical model for estimating standby and switching power dissipation in deep submicron CMOS digital circuits. The model is based on Berkeley S...
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...