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ICSE
2008
IEEE-ACM
16 years 5 months ago
The effect of program and model structure on mc/dc test adequacy coverage
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
138
Voted
ICCAD
2005
IEEE
101views Hardware» more  ICCAD 2005»
16 years 1 months ago
FastSies: a fast stochastic integral equation solver for modeling the rough surface effect
In this paper we describe several novel sparsification techniques used in a Fast Stochastic Integral Equation Solver to compute the mean value and the variance of capacitance of ...
Zhenhai Zhu, Jacob K. White
ICCAD
2004
IEEE
120views Hardware» more  ICCAD 2004»
16 years 1 months ago
A stochastic integral equation method for modeling the rough surface effect on interconnect capacitance
In this paper we describe a stochastic integral equation method for computing the mean value and the variance of capacitance of interconnects with random surface roughness. An ens...
Zhenhai Zhu, Jacob White, Alper Demir
ICC
2008
IEEE
15 years 11 months ago
Analysis and Modeling of Near-Field Effects on the Link Budget for UWB-WPAN Channels
Zoubir Irahhauten, Javier Dacuna, Gerard J. M. Jan...
IPC
2007
IEEE
15 years 10 months ago
Mining User Models for Effective Adaptation of Context-Aware Applications
Current context-aware adaptation techniques are limited in their support for user personalisation. Complex codebases, a reliance on developer modification and an inability to auto...
Shiu Lun Tsang, Siobhán Clarke