303 search results - page 49 / 61 » Efficient Design Error Correction of Digital Circuits |
ICCD
2004
IEEE
14 years 5 months ago
2004
IEEE
In modern technologies, process variations can be quite substantial, often causing design timing failures. It is essential that those errors be correctly and quickly diagnosed. In...
DAC
2004
ACM
14 years 9 months ago
2004
ACM
Parametric representations used for symbolic simulation of circuits usually use BDDs. After a few steps of symbolic simulation, state set representation is converted from one para...
DAC
2008
ACM
14 years 9 months ago
2008
ACM
Due to recent advances in microfluidics technology, digital microfluidic biochips and their associated CAD problems have gained much attention, most of which has been devoted to d...
DAC
2010
ACM
14 years 19 days ago
2010
ACM
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...
TCAD
2008
13 years 8 months ago
2008
The nonuniform substrate thermal profile and process variations are two major concerns in the present-day ultradeep submicrometer designs. To correctly predict performance/ leakage...