303 search results - page 51 / 61 » Efficient Design Error Correction of Digital Circuits |
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
SIGMETRICS
2008
ACM
13 years 8 months ago
2008
ACM
Two schemes proposed to cope with unrecoverable or latent media errors and enhance the reliability of RAID systems are examined. The first scheme is the established, widely used d...
DAC
2003
ACM
14 years 9 months ago
2003
ACM
Power dissipation is becoming the most challenging design constraint in nanometer technologies. Among various design implementation schemes, standard cell ASICs offer the best pow...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
DAC
2005
ACM
14 years 9 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...