Exploiting the underutilisation of variable-length DSP algorithms during normal operation is vital, when seeking to maximise the achievable functionality of an application within ...
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
In this paper, an adaptive sampling method is proposed for the statistical SRAM cell analysis. The method is composed of two components. One part is the adaptive sampler that manip...
—Soft error rates are an increasing problem in modern VLSI circuits. Commonly used error correcting codes reduce soft error rates in large memories and second level caches but ar...
The dynamic instruction scheduling logic is one of the most critical components of modern superscalar microprocessors, both from the delay and power dissipation standpoints. The d...
Joseph J. Sharkey, Kanad Ghose, Dmitry V. Ponomare...