2620 search results - page 147 / 524 » Efficient Hardware Voxelization |
119
click to vote
DATE
2007
IEEE
15 years 11 months ago
2007
IEEE
Device scaling in new and future technologies brings along severe increase in the soft error rate of circuits, for combinational and sequential logic. Although potential solutions...
146
click to vote
DFT
2006
IEEE
15 years 10 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
162
click to vote
ICCD
2005
IEEE
15 years 10 months ago
2005
IEEE
As power density increases exponentially, run-time regulation of operating temperature by dynamic thermal management becomes imperative. This paper proposes a novel approach to re...
152
click to vote
ISCA
2005
IEEE
15 years 10 months ago
2005
IEEE
One of the most important problems faced by microarchitecture designers is the poor scalability of some of the current solutions with increased clock frequencies and wider pipelin...
155
click to vote
ISLPED
2005
ACM
15 years 10 months ago
2005
ACM
Concerns about the reliability of real-time embedded systems that employ dynamic voltage scaling has recently been highlighted [1,2,3], focusing on transient-fault-tolerance techn...