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ISQED
2005
IEEE
91views Hardware» more  ISQED 2005»
14 years 3 months ago
Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning
Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Gh...
KR
2010
Springer
14 years 3 months ago
Efficient Dominance Testing for Unconditional Preferences
Ganesh Ram Santhanam, Samik Basu, Vasant Honavar
FOCS
1999
IEEE
14 years 2 months ago
Efficient Testing of Large Graphs
Noga Alon, Eldar Fischer, Michael Krivelevich, Mar...