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ISQED
2005
IEEE
91views Hardware» more  ISQED 2005»
15 years 8 months ago
Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning
Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Gh...
113
Voted
KR
2010
Springer
15 years 7 months ago
Efficient Dominance Testing for Unconditional Preferences
Ganesh Ram Santhanam, Samik Basu, Vasant Honavar
94
Voted
FOCS
1999
IEEE
15 years 6 months ago
Efficient Testing of Large Graphs
Noga Alon, Eldar Fischer, Michael Krivelevich, Mar...