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» Efficiently generating test vectors with state pruning
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ICAI
2009
13 years 5 months ago
On the Construction of Initial Basis Function for Efficient Value Function Approximation
- We address the issues of improving the feature generation methods for the value-function approximation and the state space approximation. We focus the improvement of feature gene...
Chung-Cheng Chiu, Kuan-Ta Chen
DATE
2006
IEEE
82views Hardware» more  DATE 2006»
14 years 1 months ago
Concurrent core test for SOC using shared test set and scan chain disable
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
Gang Zeng, Hideo Ito
PTS
2008
165views Hardware» more  PTS 2008»
13 years 9 months ago
Test Plan Generation for Concurrent Real-Time Systems Based on Zone Coverage Analysis
The state space explosion due to concurrency and timing constraints of concurrent real-time systems (CRTS) presents significant challenges to the verification engineers. In this pa...
Farn Wang, Geng-Dian Huang
DATE
2007
IEEE
81views Hardware» more  DATE 2007»
14 years 1 months ago
Using the inter- and intra-switch regularity in NoC switch testing
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...
Mohammad Hosseinabady, Atefe Dalirsani, Zainalabed...
DFT
2003
IEEE
98views VLSI» more  DFT 2003»
14 years 25 days ago
Constrained ATPG for Broadside Transition Testing
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
Xiao Liu, Michael S. Hsiao