257 search results - page 13 / 52 » Electronic circuit reliability modeling |
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
Abstract—This work proposes reliability aware through silicon via (TSV) planning for the 3D stacked silicon integrated circuits (ICs). The 3D power distribution network is modele...
ISQED
2006
IEEE
14 years 3 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
ISQED
2009
IEEE
14 years 4 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
GLVLSI
2010
IEEE
14 years 2 months ago
2010
IEEE
Graphene nanoribbon tunneling FETs (GNR TFETs) are promising devices for post-CMOS low-power applications because of the low subthreshold swing, high Ion/Ioff, and potential for l...
GECCO
2007
Springer
14 years 4 months ago
2007
Springer
Design for specific customer service plays a crucial role for the majority of the market in modern electronics. However, adaptability to an individual customer results in increasi...