257 search results - page 18 / 52 » Electronic circuit reliability modeling |
ICCAD
2010
IEEE
13 years 7 months ago
2010
IEEE
With aggressive technology scaling, integrated circuits suffer from everincreasing wearout effects and their lifetime reliability has become a serious concern for the industry. Fo...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
DSN
2005
IEEE
14 years 3 months ago
2005
IEEE
Register files are in the critical path of most high-performance processors and their latency is one of the most important factors that limit their size. Our goal is to develop er...
DAC
1998
ACM
14 years 10 months ago
1998
ACM
As VLSI circuit speeds have increased, reliable chip and system design can no longer be performed without accurate threedimensional interconnect models. In this paper, we describe...
DAC
2006
ACM
14 years 3 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...