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» Electronic circuit reliability modeling
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ISPD
2006
ACM
103views Hardware» more  ISPD 2006»
14 years 3 months ago
High accurate pattern based precondition method for extremely large power/ground grid analysis
In this paper, we propose more accurate power/ground network circuit model, which consider both via and ground bounce effects to improve the performance estimation accuracy of on-...
Jin Shi, Yici Cai, Sheldon X.-D. Tan, Xianlong Hon...
ONDM
2007
13 years 11 months ago
Optical IP Switching for Dynamic Traffic Engineering in Next-Generation Optical Networks
WDM technology has increased network link capacity dramatically, moving the network bottleneck from the transport to the routing layer. Hybrid electro-optical architectures seem at...
Marco Ruffini, Donal O'Mahony, Linda Doyle
ICCAD
2010
IEEE
125views Hardware» more  ICCAD 2010»
13 years 7 months ago
Peak current reduction by simultaneous state replication and re-encoding
Reducing circuit's peak current plays an important role in circuit reliability in deep sub-micron era. For sequential circuits, it is observed that the peak current has a str...
Junjun Gu, Gang Qu, Lin Yuan, Qiang Zhou
ICCAD
2008
IEEE
106views Hardware» more  ICCAD 2008»
14 years 6 months ago
Process variability-aware transient fault modeling and analysis
– Due to reduction in device feature size and supply voltage, the sensitivity of digital systems to transient faults is increasing dramatically. As technology scales further, the...
Natasa Miskov-Zivanov, Kai-Chiang Wu, Diana Marcul...
GLVLSI
2010
IEEE
183views VLSI» more  GLVLSI 2010»
13 years 12 months ago
Semi-analytical model for schottky-barrier carbon nanotube and graphene nanoribbon transistors
This paper describes a physics-based semi-analytical model for Schottky-barrier carbon nanotube (CNT) and graphene nanoribbon (GNR) transistors. The model includes the treatment o...
Xuebei Yang, Gianluca Fiori, Giuseppe Iannaccone, ...