257 search results - page 34 / 52 » Electronic circuit reliability modeling |
ISCAS
2002
IEEE
14 years 2 months ago
2002
IEEE
We have implemented an aspect of learning and memory in the nervous system using analog electronics. Using a simple synaptic circuit we realize networks with Hebbian type adaptati...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
Many recent techniques for timing analysis under variability, in which delay is an explicit function of underlying parameters, may be described as parameterized timing analysis. T...
ISLPED
2003
ACM
14 years 3 months ago
2003
ACM
Power dissipation is unevenly distributed in modern microprocessors leading to localized hot spots with significantly greater die temperature than surrounding cooler regions. Exc...
ISQED
2010
IEEE
14 years 4 months ago
2010
IEEE
With the CMOS transistors being scaled to sub 45nm and lower, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging pr...
CORR
2008
Springer
13 years 10 months ago
2008
Springer
This paper considers an additive noise channel where the time-k noise variance is a weighted sum of the squared magnitudes of the previous channel inputs plus a constant. This chan...