257 search results - page 46 / 52 » Electronic circuit reliability modeling |
VLSID
2003
IEEE
14 years 10 months ago
2003
IEEE
Abstract-- In battery driven portable applications, the minimization of energy, average power, peak power, and peak power differential are equally important to improve reliability ...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
Abstract—Recent breakthroughs in circuit and process technology have enabled new usage models for non-volatile memory technologies such as Flash and phase change RAM (PCRAM) in t...
SLIP
2009
ACM
14 years 4 months ago
2009
ACM
Different interconnection structures have been proposed to solve the performance limitation caused by scaling of on-chip global wires. In this paper, we give an overview of curre...
ICCAD
2000
IEEE
14 years 2 months ago
2000
IEEE
— Memory is one of the most important components to be optimized in the several phases of the synthesis process. ioral synthesis, a memory is viewed as an abstract construct whic...
ISLPED
2003
ACM
14 years 3 months ago
2003
ACM
We introduce and analyze the ground bounce due to power mode transition in power gating structures. To reduce the ground bounce, we propose novel power gating structures in which ...