257 search results - page 48 / 52 » Electronic circuit reliability modeling |
GLVLSI
2005
IEEE
14 years 3 months ago
2005
IEEE
We perform a detailed study of various crosstalk scenarios in VDSM technologies by using a distributed model of the crosstalk site and make a number of key observations about the ...
HPCA
2006
IEEE
14 years 10 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
ICCD
2008
IEEE
14 years 6 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
In modern digital ICs, the increasing demand for performance and throughput requires operating frequencies of hundreds of megahertz, and in several cases exceeding the gigahertz r...