38 search results - page 3 / 8 » Electrothermal analysis and optimization techniques for nano... |
TVLSI
2010
13 years 1 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...
VLSID
2009
IEEE
14 years 7 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
The scaling of CMOS technology into the nanometer era enables the fabrication of highly integrated systems, which increasingly contain analog and/or RF parts. However, scaling into...
ISLPED
2006
ACM
14 years 1 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
DATE
2010
IEEE
14 years 3 days ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...