67 search results - page 6 / 14 » Embedded Deterministic Test for Low-Cost Manufacturing Test |
ICCD
2005
IEEE
14 years 4 months ago
2005
IEEE
The manufacturing test cost for mixed-signal SOCs is widely recognized to be much higher than that for digital SOCs. It has been shown in recent prior work that the use of analog ...
SEUS
2007
IEEE
14 years 1 months ago
2007
IEEE
In this paper we present a distributed Hardware-in-the-Loop (HiL) simulation approach that supports the verification and validation activities in an integrated architecture as rec...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
Advances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design, in which every circuit is designed from scratch and reuse...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
— This paper proposes a novel self-healing methodology for embedded RF Amplifiers (LNAs) in RF sub-systems. The proposed methodology is based on oscillation principles in which t...
ATS
2001
IEEE
13 years 11 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...