In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
System-on-Chip (SoC) is a promising paradigm to implement safety-critical embedded systems, but it poses significant challenges from a design and verification point of view. In ...
Rodolfo Pellizzoni, Patrick O'Neil Meredith, Min-Y...
Cutting-edge applications of future embedded systems demand highest processor performance with low power consumption to get acceptable battery-life times. Therefore, low power opt...
Anupam Chattopadhyay, B. Geukes, David Kammler, Er...
There is an increasing demand to introduce adaptive capabilities in distributed real-time and embedded (DRE) systems that execute in open environments where system operational con...
Nishanth Shankaran, Xenofon D. Koutsoukos, Douglas...
— We discuss the design of CMOS MEMS in a 3D SOI-CMOS technology. We present layout architectures, preliminary mechanics modeling using finite element analysis and release proce...