Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
Abstract-- SAT sweeping is the process of merging two or more functionally equivalent nodes in a circuit by selecting one of them to represent all the other equivalent nodes. This ...
Stephen Plaza, Kai-Hui Chang, Igor L. Markov, Vale...
We propose a new method for generating BDDs from hardware algorithm descriptions written in a programming language. Our system can deal with control structures, such as conditiona...
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
State Machines Capture Parallel Algorithms: Correction and Extension ANDREAS BLASS University of Michigan and YURI GUREVICH Microsoft Research We consider parallel algorithms worki...