Recently, a new Dynamic Voltage Scaling (DVS) scheme has been proposed that increases energy efficiency significantly by allowing the processor to operate at or slightly below the...
David Roberts, Todd M. Austin, David Blaauw, Trevo...
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...
With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
A methodology is proposed to efficiently estimate the substrate noise generated by large scale aggressor circuits. Small spatial voltage differences within the ground distribution...
Emre Salman, Renatas Jakushokas, Eby G. Friedman, ...
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...