108 search results - page 1 / 22 » Error Analysis for the Support of Robust Voltage Scaling |
ISQED
2005
IEEE
14 years 28 days ago
2005
IEEE
Recently, a new Dynamic Voltage Scaling (DVS) scheme has been proposed that increases energy efficiency significantly by allowing the processor to operate at or slightly below the...
DSN
2008
IEEE
14 years 1 months ago
2008
IEEE
As semiconductor technology scales, reliability is becoming an increasingly crucial challenge in microprocessor design. The rSRAM and voltage scaling are two promising circuit-lev...
DFT
2008
IEEE
14 years 1 months ago
2008
IEEE
With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
A methodology is proposed to efficiently estimate the substrate noise generated by large scale aggressor circuits. Small spatial voltage differences within the ground distribution...
DATE
2005
IEEE
14 years 29 days ago
2005
IEEE
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and suppl...