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VLSID
2006
IEEE
129views VLSI» more  VLSID 2006»
14 years 10 months ago
A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...
FDTC
2010
Springer
132views Cryptology» more  FDTC 2010»
13 years 8 months ago
Fault Injection Resilience
Fault injections constitute a major threat to the security of embedded systems. The errors in the cryptographic algorithms have been shown to be extremely dangerous, since powerful...
Sylvain Guilley, Laurent Sauvage, Jean-Luc Danger,...
ICCAD
2005
IEEE
147views Hardware» more  ICCAD 2005»
14 years 7 months ago
NoCEE: energy macro-model extraction methodology for network on chip routers
In this paper we present NoCEE, a fast and accurate method for extracting energy models for packet-switched Network on Chip (NoC) routers. Linear regression is used to model the r...
Jeremy Chan, Sri Parameswaran
DAC
2008
ACM
14 years 11 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...
DAC
2002
ACM
14 years 11 months ago
Hole analysis for functional coverage data
One of the main goals of coverage tools is to provide the user with informative presentation of coverage information. Specifically, information on large, cohesive sets of uncovere...
Oded Lachish, Eitan Marcus, Shmuel Ur, Avi Ziv