68 search results - page 3 / 14 » Evaluation of voltage interpolation to address process varia... |
DATE
2010
IEEE
14 years 16 days ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
Process related variations are considered a major concern in emerging sub-65nm technologies. In this paper, we investigate the impact of process variations on different types of c...
VLSID
2010
IEEE
13 years 5 months ago
2010
IEEE
Due to the inherent nature of heat flow in 3D integrated circuits, stacked dies exhibit a wide range of thermal characteristics. The strong dependence of leakage with temperature...
FPGA
2009
ACM
14 years 2 days ago
2009
ACM
This paper presents a new architecture for time-to-digital conversion enabling a time resolution of 17ps over a range of 50ns with a conversion rate of 20MS/s. The proposed archit...
ISQED
2008
IEEE
14 years 1 months ago
2008
IEEE
Influence of manufacturing variability on circuit performance has been increasing because of finer manufacturing process and lowered supply voltage. In this paper, we focus on m...