469 search results - page 1 / 94 » Evolutionary Approach to Test Generation for Functional BIST |
CORR
2010
Springer
13 years 4 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
DATE
2000
IEEE
13 years 11 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
DELTA
2008
IEEE
14 years 1 months ago
2008
IEEE
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...