— The main thesis of this paper is to perform a reliability based performance analysis for a shared latch inserted global interconnect under uncertainty. We first put forward a ...
— Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock t...
There is an increased dominance of intra-die process variations, creating a need for an accurate and fast statistical timing analysis. Most of the recent proposed approaches assum...
This paper studies a general dynamic buffer management problem with one buffer inserted between two interacting components. The component to be controlled is assumed to have multi...
Clock distribution networks are an important design issue that is highly dependent on delay variations and load imbalances, while requiring power efficiency. Existing mesh solutio...
Inna Vaisband, Ran Ginosar, Avinoam Kolodny, Eby G...