414 search results - page 35 / 83 » Fault Detection Effectiveness of Spathic Test Data |
SENSYS
2009
ACM
14 years 2 months ago
2009
ACM
Soil contains vast ecosystems that play a key role in the Earth’s water and nutrient cycles, but scientists cannot currently collect the high-resolution data required to fully u...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...
TC
1998
13 years 7 months ago
1998
—The very high levels of integration and submicron device sizes used in current and emerging VLSI technologies for FPGAs lead to higher occurrences of defects and operational fau...
ASPLOS
2010
ACM
14 years 2 months ago
2010
ACM
Computer systems with virtual memory are susceptible to design bugs and runtime faults in their address translation (AT) systems. Detecting bugs and faults requires a clear speciï...
VTS
2006
IEEE
14 years 1 months ago
2006
IEEE
A new algorithm for identifying stuck faults in combinational circuits that cannot be detected by a given input sequence is presented. Other than pre and post-processing steps, ce...