A fault fj is said to dominate another fault fi if all tests for fi detect fj . When two faults dominate each other, they are called equivalent. Dominance and equivalence relation...
Vishwani D. Agrawal, A. V. S. S. Prasad, Madhusuda...
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
Philip P. Shirvani, Subhasish Mitra, Jo C. Ebergen...
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...
M. J. Geuzebroek, J. Th. van der Linden, A. J. van...