: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith...
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...