In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
The reusing of the same hardware resources to implement speed-critical algorithms, without interrupting system operation, is one of the main reasons for the increasing use of reco...
Manuel G. Gericota, Gustavo R. Alves, Miguel L. Si...
This paper discusses fault-tolerant techniques for SRAM-based FPGAs. These techniques can be based on circuit level modifications, with obvious modifications in the programmable a...
Fernanda Lima Kastensmidt, Gustavo Neuberger, Luig...
— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally efï¬...