An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...