372 search results - page 53 / 75 » Fault simulation on reconfigurable hardware |
VTS
2007
IEEE
14 years 3 months ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
IPPS
2000
IEEE
14 years 1 months ago
2000
IEEE
The Simultaneous Optical Multiprocessor Exchange Bus (SOME-Bus) is a low-latency, high-bandwidth interconnection network which directly links arbitrary pairs of processor nodes wit...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
ISCA
2005
IEEE
14 years 2 months ago
2005
IEEE
CMOS scaling increases susceptibility of microprocessors to transient faults. Most current proposals for transient-fault detection use full redundancy to achieve perfect coverage ...
APCCAS
2006
IEEE
14 years 27 days ago
2006
IEEE
A new low offset dynamic comparator for high resolution high speed analog-to-digital application has been designed. Inputs are reconfigured from the typical differential pair compa...