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DATE
2000
IEEE
136views Hardware» more  DATE 2000»
13 years 12 months ago
Parametric Fault Simulation and Test Vector Generation
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
Khaled Saab, Naim Ben Hamida, Bozena Kaminska
AAAI
2008
13 years 9 months ago
Computing Observation Vectors for Max-Fault Min-Cardinality Diagnoses
Model-Based Diagnosis (MBD) typically focuses on diagnoses, minimal under some minimality criterion, e.g., the minimal-cardinality set of faulty components that explain an observa...
Alexander Feldman, Gregory M. Provan, Arjan J. C. ...
DATE
2008
IEEE
104views Hardware» more  DATE 2008»
14 years 1 months ago
Diagnostic Analysis of Static Errors in Multi-Step Analog to Digital Converters
– A new approach for diagnostic analysis of static errors in multi-step ADC based on the steepestdescent method is proposed. To set initial data, estimate the parameter update an...
Amir Zjajo, José Pineda de Gyvez
DATE
2006
IEEE
96views Hardware» more  DATE 2006»
14 years 1 months ago
On the relation between simulation-based and SAT-based diagnosis
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
Görschwin Fey, Sean Safarpour, Andreas G. Ven...
DATE
2008
IEEE
74views Hardware» more  DATE 2008»
14 years 1 months ago
A Design-for-Diagnosis Technique for SRAM Write Drivers
∗ Diagnosis is becoming a major concern with the rapid development of semiconductor memories. It provides information about the location of manufacturing defects in the memory, a...
Alexandre Ney, Patrick Girard, Serge Pravossoudovi...