10715 search results - page 103 / 2143 » From Tests to Proofs |
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
– In this paper, we present an open architecture Virtual Test Environment (VTE) which can be easily integrated into various modularized Automatic Test Systems (ATS) compliant to ...
XPU
2004
Springer
14 years 2 months ago
2004
Springer
Abstract. While there are many excellent acceptance testing tools and frameworks available today, this paper presents an alternative approach, involving generating code from tests ...
ITC
2002
IEEE
14 years 2 months ago
2002
IEEE
ct Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment that...
DATE
1999
IEEE
14 years 1 months ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
DELTA
2008
IEEE
14 years 3 months ago
2008
IEEE
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...