36 search results - page 1 / 8 » Fully Automatic Test Program Generation for Microprocessor C... |
DATE
2003
IEEE
14 years 20 days ago
2003
IEEE
GECCO
2005
Springer
14 years 27 days ago
2005
Springer
Checking if microprocessor cores are fully functional at the end of the productive process has become a major issue. Traditional functional approaches are not sufficient when cons...
SBCCI
2005
ACM
14 years 28 days ago
2005
ACM
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
ISQED
2002
IEEE
14 years 9 days ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
ICTAI
2000
IEEE
13 years 11 months ago
2000
IEEE