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17

DATE
2003
IEEE

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Fully Automatic Test Program Generation for Microprocessor Cores

14 years 20 days ago

Fully Automatic Test Program Generation for Microprocessor Cores

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Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda

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DATE 2003 | Hardware |

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	DATE
Authors	Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda, Giovanni Squillero

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