192 search results - page 12 / 39 » Functional Scan Chain Testing |
ITC
1996
IEEE
14 years 1 months ago
1996
IEEE
Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
ATS
1996
IEEE
14 years 1 months ago
1996
IEEE
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
ICCAD
2000
IEEE
14 years 1 months ago
2000
IEEE
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...
ICCAD
1997
IEEE
14 years 1 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
ITC
2002
IEEE
14 years 2 months ago
2002
IEEE
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...