192 search results - page 21 / 39 » Functional Scan Chain Testing |
IPMI
2003
Springer
14 years 10 months ago
2003
Springer
Abstract. Estimating statistical significance of detected differences between two groups of medical scans is a challenging problem due to the high dimensionality of the data and th...
DATE
1999
IEEE
14 years 1 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
ASPDAC
2005
ACM
13 years 11 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
TVLSI
1998
13 years 8 months ago
1998
Abstract—We introduce a technique for on-line built-in selftesting (BIST) of bus-based field programmable gate arrays (FPGA’s). This system detects deviations from the intende...