192 search results - page 8 / 39 » Functional Scan Chain Testing |
ICCAD
2003
IEEE
14 years 6 months ago
2003
IEEE
Path delay fault testing becomes increasingly important due to higher clock rates and higher process variability caused by shrinking geometries. Achieving high-coverage path delay...
ICCD
2007
IEEE
14 years 6 months ago
2007
IEEE
Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
TODAES
2011
13 years 4 months ago
2011
—In this paper, we present an attack on stream cipher implementations by determining the scan chain structure of the linear feedback shift registers in their implementations. Alt...
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...