82 search results - page 4 / 17 » Functional Testing of Microprocessors with Graded Fault Cove... |
CASES
2006
ACM
13 years 11 months ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
ATS
2003
IEEE
14 years 23 days ago
2003
IEEE
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
ISQED
2002
IEEE
14 years 12 days ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
DFT
2002
IEEE
14 years 13 days ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...