138 search results - page 25 / 28 » Functional test generation for delay faults in combinational... |
SEDE
2007
13 years 9 months ago
2007
— Achieving reliability in fault tolerant systems requires both avoidance and redundancy. This study focuses on avoidance as it pertains to the design of microchips. The lifecycl...
DAC
2006
ACM
13 years 9 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
As semiconductor manufacturing requires greater capital investments, the use of contract foundries has grown dramatically, increasing exposure to mask theft and unauthorized exces...
ISCAS
2006
IEEE
14 years 1 months ago
2006
IEEE
— The rapid control of sonar-guided vehicles through obstacle fields has been a goal of robotics for decades. How sensory data is represented strongly affects how obstacles and g...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...