Approaches to achieve low-power and high-speed VLSI's are described with the emphasis on techniques across multiple technology and design levels. To suppress the leakage curr...
The temperature dependence of MOSFET drain current varies with supply voltage. Two distinct voltage regions exist—a normal dependence (ND) region where an increase in temperatur...
In this paper, we present a novel statistical full-chip leakage power analysis method. The new method can provide a general framework to derive the full-chip leakage current or po...
Ruijing Shen, Ning Mi, Sheldon X.-D. Tan, Yici Cai...
– In the sub-65 nm CMOS technologies, subthreshold and gate dielectric leakage currents need to be simultaneously suppressed for effective energy reduction. New low-leakage circu...
Current formal models for quantum computation deal only with unitary gates operating on “pure quantum states”. In these models it is difficult or impossible to deal formally w...