Diagnosis algorithms targeting design errors in RTL circuit descriptions are presented in this paper. The algorithms presented exploit the hierarchy available in RTL designs to lo...
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
This paper describes an approach to design error diagnosis and correction in combinational digital circuits. Our approach targets small errors introduced during the design process...
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikara...
Commonly used pattern sources in simulation-based verification include random, guided random, or design verification patterns. Although these patterns may help bring the design ...
Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng, John Moo...