Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
Jaan Raik, Raimund Ubar, Anna Krivenko, Margus Kru...
This paper presents a new and low-cost approach for identifying sequentially untestable faults. Unlike the single fault theorem, where the stuck-at fault is injected only in the r...
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
In this paper, we make two major contributions: First, to enhance Boolean learning, we propose a new class of logic implications called extended forward implications. Using a nove...
: This paper presents a novel, low cost technique based on implications to identify untestable bridging faults in sequential circuits. Sequential symbolic simulation [1] is first p...
Manan Syal, Michael S. Hsiao, Kiran B. Doreswamy, ...