The importance of fault tolerance at the processor architecture level has been made increasingly important due to rapid advancements in the design and usage of high performance de...
T. S. Ganesh, Viswanathan Subramanian, Arun K. Som...
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...
M. Haykel Ben Jamaa, Gianfranco Cerofolini, Yusuf ...
In this paper we present a completely on-chip voltage regulation technique which promises to adjust the degree of voltage regulation in a digital logic chip in the face of process...
Nicola Dragone, Akshay Aggarwal, L. Richard Carley