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» High Level Synthesis of Timed Asynchronous Circuits
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EDCC
2006
Springer
13 years 11 months ago
SEU Mitigation Techniques for Microprocessor Control Logic
The importance of fault tolerance at the processor architecture level has been made increasingly important due to rapid advancements in the design and usage of high performance de...
T. S. Ganesh, Viswanathan Subramanian, Arun K. Som...
ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
14 years 2 months ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson
ITC
2002
IEEE
114views Hardware» more  ITC 2002»
14 years 17 days ago
Scan Power Reduction Through Test Data Transition Frequency Analysis
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
CASES
2009
ACM
14 years 10 days ago
Complete nanowire crossbar framework optimized for the multi-spacer patterning technique
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...
M. Haykel Ben Jamaa, Gianfranco Cerofolini, Yusuf ...
ISLPED
2000
ACM
70views Hardware» more  ISLPED 2000»
14 years 8 hour ago
An adaptive on-chip voltage regulation technique for low-power applications
In this paper we present a completely on-chip voltage regulation technique which promises to adjust the degree of voltage regulation in a digital logic chip in the face of process...
Nicola Dragone, Akshay Aggarwal, L. Richard Carley