18572 search results - page 3538 / 3715 » High performance C |
ICCD
2006
IEEE
14 years 6 months ago
2006
IEEE
— As silicon CMOS devices are scaled down into the nanoscale regime, new challenges at both the device and system level are arising. While some of these challenges will be overco...
ICCD
2003
IEEE
14 years 6 months ago
2003
IEEE
There is a growing interest in the use of speculative multithreading to speed up the execution of a program. In speculative multithreading model, threads are extracted from a sequ...
ICCAD
2008
IEEE
14 years 6 months ago
2008
IEEE
Abstract— As VLSI technology enters the nanoscale regime, interconnect delay becomes the bottleneck of circuit performance. Compared to gate delays, wires are becoming increasing...
ICCAD
2007
IEEE
14 years 6 months ago
2007
IEEE
Modern processing technologies offer a number of types of devices such as high-VT , low-VT , thick-oxide, etc. in addition to the nominal transistor in order to meet system perfor...
ICCAD
2006
IEEE
14 years 6 months ago
2006
IEEE
- Redundant via insertion and line end extension employed in the post-routing stage are two well known and highly recommended techniques to reduce yield loss due to via failure. Ho...